When do we use Near-field Probes for EMC Testing?
Near-field probes are used to make measurements of high-frequency, electric and magnetic RF fields. They are used to measure electrical noise and other undesirable electromagnetic radiation from the DUT (device under test). Near field probes are then connected to spectrum analyzers and oscilloscope where their readings can be seen/evaluated.
There are two types of near-field probes – E-Field probes and H-Field probes.
E-Field Probes measures electric field strength and provides X, Y and Z as well as total field values. Data from each axis can be viewed individually or summed. The field probe is fiber optically coupled to the readout or PC interface to eliminate the possibility of cable interference.
H-Field Probes use a conductive loop to detect magnetic fields produced by clock signals, serial data streams, control signals, and switching power supplies. The probes produce a voltage proportional to the magnetic field that's perpendicular to the loop.
A near-field probe is an essential tool for quick and efficient EMC/EMI engineering. Using near-field probes and an oscilloscope can produce the following results:
- Gain information about the source and location of the radiation member.
- Reduce test expenses by adding inexpensive equipment for solving EMC/EMI problems.
- Reduce test time by pre-screening various solutions and alternate implementations.
everything RF has listed near field probes that can be used for EMC testing from the leading manufacturers. The list of near field probes can be narrowed down by E-field or H-field and a number of other parameters. View product specifications, download datasheets, and request quotes for near field probes that meet your requirement.
