Texas Instruments has introduced the highest level of RF sampling performance with the ADC32RF45, the fastest 14-bit analog-to-digital converter (ADC). This dual-channel ADC enables direct RF signal conversion up to 4 GHz, giving engineers access to the highest dynamic range and input bandwidth. The first in a new data converter family in TI's RF sampling portfolio, this ADC32RF45 eliminates up to four intermediate-frequency down conversion stages in multiband receivers, which simplifies system architecture and reduces board space up to 75 percent.
Direct RF sampling meets engineers’ requirements for higher integration, better noise performance, wider bandwidth and smaller footprints in radar, software-defined radio, aerospace and defense, test and measurement, wireless communication, and radio astronomy systems.
Key features and benefits:
- Support for RF inputs up to 4 GHz enables direct RF signal conversion in the first, second and third Nyquist zones (including all L- and S-band frequency ranges). This reduces filter complexity, saves board space and decreases component count.
- It detects even the weakest signals with industry-leading noise-spectral density of -155 dBFS/Hz, 5 dB better than competitive devices. It offers industry-leading signal-to-noise ratio of 58.5 dB at a 1.8-GHz input frequency.
- Fastest 14-bit ADC with a 3-GSPS maximum sample rate delivers an instantaneous 1.5-GHz-per-channel bandwidth, enabling engineers to implement wideband in-phase and quadrature-component receivers beyond 2.5 GHz.
- The multiband digital downconverter extracts one or two sub-bands per channel, a dramatic digital interface data throughput reduction by up to 92 percent, saving system size, power and processing resources.
In addition to the ADC32RF45EVM available today, the ADC32RF45 will be in volume production by the third quarter of 2016 in a 72-pin, 20 x 10 mm QFN package.
Stop by the TI Booth (#419) at IMS 2016 to experience the ADC32RF45. You can also read the 10 part blog on RF Sampling here.
