Altair Semiconductor has selected Rohde & Schwarz as its strategic partner for test equipment for its dual-mode CAT-M1/NB1 IOT chipset - the ALT1250, as well as other next-generation IOT chipsets. R&S test equipment will be used for protocol testing as well as RF, RRM performance and carrier tests.
The ALT1250 is a highly integrated dual-mode CAT-M1/NB-IoT chipset. Modules built with the ALT1250 can be very small measuring only 100mm2 in area. This chipset includes GNSS location positioning, a wideband RF front-end supporting all commercial LTE bands within a single hardware design, a multi-layered and hardware-based security framework, an internal application subsystem and packaging that enables standard, low-cost PCB manufacturing.
The R&S CMW500 is the leading test platform, offering the most validated CAT-M1/NB-IoT protocol conformance tests. It allows manufacturers and test houses to use a single instrument to verify that chipsets, modules and devices comply with GCF and PTCRB standards, and specific network operator requirements.
Altair will be demonstrating modules based on the ALT1250 at Mobile World Congress (MWC) in Barcelona, Spain from February 26 to March 1, 2018.
