LTE Terminal Tests under Fading Conditions with R&S®CMW500 and R&S®AMU200A
This application note shows how to perform LTE terminal block error rate (BLER) and throughput tests under fading conditions with the R&S®CMW500 Protocol Tester and the R&S®AMU200A Fading Simulator.
Please note:
By downloading a white paper/e-Book, your contact information will be shared with the sponsoring company, Rohde & Schwarz GmbH & Co.KG and the Rohde & Schwarz entity or subsidiary company mentioned in the imprint of www.rohde-schwarz.com, and you may be contacted by them directly via email or phone for marketing or advertising purposes subject to their statement of privacy.