MPI Corporation introduced the TITAN Multi-Contact Probe, further advancing the company’s TITAN RF probing technology for the challenges of testing modern Si RF ICs. TITAN Multi-Contact Probe allows customers to configure up to 15 probe channels for RF, bias, and logic IC terminals featuring the company’s proprietary MEMS contact tip with the one-of-a-kind contact point visibility. It offers the unique combination of the contact width of 20 μm with the smallest probe pitch starting from 50 μm, and the longest lifespan of over 1 million touchdown cycles on Al pads.
Andrej Rumiantsev, Director of RF Technologies of MPI Corporation’s Advanced Semiconductor Division said TITAN Multi-Contact Probe was designed to reduce the cost of test of modern silicon highly-integrated RF ICs by probing on small pads and providing the longest lifespan, affordable price, and short lead time. He also pointed out that being the shortest probe of its kind, it enables over-temperature characterization of large ICs in the shielded environment over a wide temperature range and, at the same time.
