MPI Introduces the TITAN Multi-Contact Probe for RF IC Characterization

MPI Introduces the TITAN Multi-Contact Probe for RF IC Characterization

MPI Corporation has introduced the TITAN Multi-Contact Probe that allows customers to configure up to 15 probe channels for RF, bias and logic IC terminals featuring the company’s proprietary MEMS contact tip with the one-of-a-kind contact point visibility. The TITAN Multi-Contact probes offer the unique combination of a contact width of 20 μm with the smallest probe pitch starting at 50 μm, and a long lifespan of over 1 million touchdown cycles on Al pads.

Andrej Rumiantsev, Director of RF Technologies of MPI Corporation’s Advanced Semiconductor Division said that the TITAN Multi-Contact Probe was designed to reduce the cost of test of modern silicon highly-integrated RF ICs by probing on small pads and providing a long probe lifespan, affordable price and short lead time. He also mentioned that being the shortest probe of its kind, it enables over-temperature characterization of large ICs in a shielded environment over a wide temperature range.

Publisher: everything RF