National Instruments today at NI Week has announced thethe Wireless Test System (WTS), a solution that dramatically lowers the cost of high-volume wireless manufacturing test. This Test Set can be used to test a range of wireless technologies including Bluetooth, WiFi, GPS and Cellular including LTE-Advanced.
The WTS combines the latest advances in PXI hardware to offer a single platform for multi-standard, multi- DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilization when testing multiple devices in parallel. The WTS integrates easily into a manufacturing line with ready-to-run test sequences for devices that use chipsets from suppliers like Qualcomm and Broadcom as well as integrated DUT and remote automation control. With these features, customers are seeing considerable efficiency gains from their RF test equipment and further reducing their cost of test.
The Test Set is built on PXI hardware and LabVIEW and TestStand software (see the Semiconductor Test System launched in 2014). With support for wireless standards from LTE Advanced to 802.11ac to Bluetooth Low Energy, the WTS is designed for manufacturing test of WLAN access points, cellular handsets, infotainment systems and other multi-standard devices that include cellular, wireless connectivity and navigation standards. Software-designed PXI vector signal transceiver technology inside the WTS delivers superior RF performance in the manufacturing test environment and a platform that can scale with the evolving requirements of RF test.
The Internet of Things is expected to push more devices to include RF and sensor functionality, which has traditionally been expensive to test. The NI Wireless Test Set based on the PXI Platform can reduce test costs and multiply throughput on the production floor with a system optimized for measurement speed and parallel test. Visit http://ni.com/wts to learn more.
