MPI Corporation's Advanced Semiconductor Test (AST) Division, a pioneer in on-wafer testing solutions, announced a landmark achievement in RF calibration technology. Collaborating with the Physikalisch-Technische Bundesanstalt (PTB) in Germany, the division has successfully achieved full traceability in characterizing a commercially available calibration substrate up to 110 GHz and set a new industry benchmark.
TCS-050-100-W Calibration Substrates Certificate
This achievement, spearheaded by Dr. Andrej Rumiantsev, Director of RF Technology at MPI-AST, represents a significant leap for the entire RF product line provided by the MPI product line. The fully traceable characterization paves the way for more accurate, reliable, and universally accepted high-frequency measurements, essential for cutting-edge technologies like 5G.
"Attaining full traceability in RF calibration at such high frequencies is a testament to our dedication to precision and quality," said Dr. Rumiantsev. "This breakthrough is an outcome of our long-term cooperation with PTB. Is not just an advancement for MPI-AST but a significant stride for the entire microwave measurement community, semiconductor and telecommunications industries."
"Establishing the national standards for RF system calibration at the wafer-level is the goal that PTB had been working towards for several years," said Dr. Uwe Arz, the head of the On-Wafer Scattering Parameters group of PTB, Germany. "We are proud to announce the solution for transferring the traceability chain to the commercial calibration substrate from MPI for the first time in the industry."
MPI-AST's latest achievement underscores its role as a leader in the semiconductor test industry, promising to open new avenues in high-frequency testing and solidifying its position as a market leader.
Click here for more information on Traceable Lumped-Element Calibrations up to 110 GHz on Commercial Calibration Substrates.
Click here for more information from PTB on the world's first calibration certificates for on-wafer measurements.
