AMCAD Engineering has introduced a VNA-based load-pull measurement solution that uses an MPI 2000 probe station, nano 5G tuners, and pulse IV system working together for precise component measurements.
This integration by MPI ensures nearly isothermal conditions and high Gammas. The measurement bench, fully automated under IVCAD software, utilizes Sentio for wafer mapping. Calibration is achieved with Qalibria software for vector calibration. The solution produces a dynamic measurement report created using WhiteBoard that reveals performance comparisons across the entire wafer.
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