At the International Microwave Symposium 2017 (IMS) taking place in Hawaii from 4-9 June, Anritsu will be showcasing its latest emerging test technologies, processes, and solutions for microwave and mmWave bands. The highlight of the exhibit will be the demonstration of benefits of its patented Nonlinear Transmission Line (NLTL) technology, as well as its signal analyzer and Vector Network Analyzer (VNA) test solutions. Anritsu will also have company experts presenting new techniques and offer insight on test challenges throughout the event.
Advanced Test Technology Exhibits
At the forefront of the test leadership will be their VectorStar and ShockLine VNA families that feature Non Linear Transmission Line (NLTL) technology. Among the benefits of the technology are superior dynamic range of >100 dB spanning microwave and mmWave frequency ranges and ultra-high stability. Additionally, it creates a much smaller form factor, as well as improved capability-to-cost ratio for more economical testing – all critical elements in high-frequency designs. NLTL benefits will be on display in the Anritsu IMS booth, where one station will feature simultaneous VNA and spectrum analysis. The demonstration will consist of fully corrected on-wafer VNA measurements from 70 kHz to 110 GHz and spectrum analysis from 10 GHz to 110 GHz using 1 mm modules and couplers with on-wafer probes.
Stability advantages of NLTL-based VNAs will be displayed in a mmWave active device measurement demonstration. S-parameter, noise figure and inter-modulation distortion measurements will be made in a simple and economical configuration. Also on display will be the 60-90 GHz E-Band ShockLine VNA, and the Ultraportable Spectrum Master VNA MS2760A that brings unprecedented measurement capability in a solution the size of a mobile device.
Anritsu will also highlight its Spectrum Analyzer/Signal Analyzer MS2830A, an economical solution that features high performance with excellent level accuracy and wide dynamic range. A built-in Vector Signal Generator (VSG) outputs continuous wave (CW) and modulated signals that can be used as reference signal sources when testing Tx characteristics as well as signal sources for evaluating Rx characteristics.
At the Anritsu booth, the MS2830A will transmit a modulated signal from the VSG that will be received on the analyzer’s input port and demodulated to display constellation diagram, power level, and EVM.
Speaking Sessions and Tutorials
Anritsu will also be participating in technical paper presentations, workshops, and tutorials throughout IMS. The sessions will provide engineers with new methods and advanced theories to give greater confidence in their high-frequency designs. The schedule will include:
- June 5: Anritsu will participate in two workshops, the first, RF to/from Bits: Challenges in High Frequency Mixed Signal Measurements and Design which also includes a 10-minute session on “Challenges in Characterization of Mixed Signal Systems” by Dr. Jon Martens of Anritsu. He will also give a 10-minute session in the second workshop entitled Millimeter-Wave Multi-GHz-IF Receivers: Linearity and Correction Considerations, as part of Novel 5G Applications of Nonlinear Vector Network Analyzer for Broadband Modulation and Millimeter Wave Characterization.
- June 7: Anritsu VNA Product Manager Steve Reyes will speak on the Future of RF Semiconductor Test, which is part of the MicroApp (Microwave Applications Seminars).
- June 9: Anritsu will take part in the 89th ARFTG Microwave Measurement Symposium on Advanced Technologies for Communications. The all-day event will incorporate oral sessions, exhibits, and interactive forums.
Click here to see IMS 2017 Event Coverage on everything RF.
