Anritsu has released a LTE Category M software release for the Universal Wireless Test Set MT8870A to support RF tests of LTE Category M devices. The release includes Category M FDD Uplink Tx measurement software (MX887065A), Category M FDD Downlink Waveform files (MV887065A) and a Fully Automatic Measurement Program, providing fast and automatic testing (Tx power, frequency, modulation accuracy, modulation sensitivity, etc.) in accordance with the 3GPP LTE Category M RF test specifications.
LTE Category M is a Cellular IoT standard included in LTE-Advanced Pro. It is a wireless technology based on License Band LPWA in parallel with NB-IoT.
The measurement of LTE Category M devices can be automated using a program to control chipsets built into target devices, but, until now, these programs required bespoke development for every customer. Anritsu has been working closely with chipset vendors to establish measurement technologies for LTE Category M devices, and have been able to develop a turnkey solution to support automated evaluation at world-beating measurement speeds for up to four LTE Category M devices and chipsets without requiring a customer-developed control program.
The Universal Wireless Test Set MT8870A is a measurement instrument for mass-production of various types of wireless communications equipment and modules. Four high-performance tester units are installed in the main unit and each unit supports parallel independent measurement for evaluation of up to four wireless devices and modules. It already fully supports 2G/3G/LTE/LTE-Advanced/NB- IoT, WLAN/Bluetooth, GPS, and FM evaluations.
Installing these software packages in the MT8870A make it the world’s first turnkey automated measurement solution for testing and evaluating the RF TRx characteristics of up to four NB-IoT devices and modules at world-beating speed on mass-production lines. The automatic measurement program eliminates the need to develop control programs and cuts development time to zero.
