At this year’s IMS 2018 event, Anritsu is showcasing its range of new technology and test solutions for high-speed commercial and military applications. Among the solutions being shown at their booth is the differential noise figure analysis capability for the VectorStar Vector Network Analyzers (VNAs) that allows engineers to conduct highly accurate tests on high-frequency components and systems.
The differential noise figure option will be introduced at IMS this year and will be integrated into a VectorStar MS4647B 4-port 70 GHz VNA. At their booth they will conduct noise figure characterization of differential devices using cold-source methods. Demonstrations will include quantification of correlated and non-correlated device-under-test (DUT) noise. A second 4-port configuration of the MS4647B with a UFX option will be highlighted at IMS, as well. Demonstrations on how its eye diagram analysis and test fixture de-embedding capability produce highly accurate measurements on differential devices will be conducted.
Anritsu will also be showing broadband, single sweep VNAs, based on the VectorStar platform, covering 70 kHz to 110 and 145 GHz. The solution features best-in-class calibration stability, high dynamic range, leveled power sweep range, and the smallest form factor millimeter (mm-Wave) modules in the industry. These broadband VNAs are ideal for applications in device characterization, high-speed communications, and automotive radar. Anritsu will also showcase their economical test solutions and high frequency test platform.
Economical Test Solutions
The ShockLine family of economical VNAs that provide excellent price/performance in high-frequency applications requiring fundamental S-parameter testing will be shown during IMS. The MS46524B 4-port 43.5 GHz VNA will conduct tests on a 38 GHz diplexer, while the MS46122B 2-port 43.5 GHz USB VNA will test a substrate filter using the Universal Test Fixture (UTF). For engineers designing E-band components and systems, the MS46522B 2-port VNA will conduct demonstrations on testing DUTs that cover the 60 GHz – 90 GHz frequency range.
Flexible High-frequency Test Platform
With up to 1 GHz analysis bandwidth, the Signal Analyzer MS2850A is a spectrum analyzer/signal analyzer that supports wider-band microwave and mm-Wave communications. Its high amplitude and phase flatness performance facilitates multicarrier signal analysis. The MS2850A’s wide dynamic range helps obtain more accurate EVM values and increases the reliability of next-generation, wideband communication systems, including 5G, broadcast satellite communications, terrestrial monitoring equipment, and wideband transponders.
Dr. Jon Martens of Anritsu will be the session chair for a panel discussion entitled, It's All About Calibration and Measurements for 5G during the ARFTG Microwave Measurement Symposium on June 15. He will also present mm-Waves and Beyond, where he will discuss mm-Wave partial information de-embedding, with a particular focus on errors and sensitivities.
Click here to see everything RF's coverage of IMS 2018.
