Anritsu Upgrades its Test Set to Provide Fast Automatic LTE-V2X Device Tests

Anritsu Upgrades its Test Set to Provide Fast Automatic LTE-V2X Device Tests

Anritsu has released two new software options for its Universal Wireless Test Set MT8870A to measure RF characteristics of 3GPP-compliant LTE-V2X (PC5) devices. Customers already using the MT8870A can extend its functionality simply by installing the software, with no need to invest in new equipment.

The new software options are LTE-V2X Tx Measurement MX887068A and LTE-V2X Waveforms MV887068A and offer the industry's fastest, fully automatic, non-signaling based LTE-V2X TRx tests.

With four TRX measurement modules installed in the MT8870A, four DUTs (devices under test) can be connected and measured simultaneously. Different wireless systems can also be measured in parallel, cutting measurement time and the space taken up by test equipment.

The new software expands the capabilities of the MT8870A Universal Wireless Test Set, which is designed for mass-production test of multi-standard wireless systems. In addition to LTE-V2X and IEEE 802.11p(DSRC) for automotive solutions, the test set also supports the latest 5G sub-6 GHz, LTE, NB-IoT, Cat-M, WLAN and Bluetooth standards. 

Anritsu developed the MT8870A solution to increase the mass-production efficiency of V2X devices and chipsets and help to accelerate the launch of commercial C-V2X services.

Publisher: everything RF
Tags:-   LTETest & Measurement3GPP

Anritsu

  • Country: United States
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