The E4727B from Keysight is a Low-Frequency Noise Analyzer for conducting fast, accurate and repeatable low-frequency noise (LFN) measurements on numerous device types. It is suitable for use in applications such as process design kit (PDK) development, IC noise specification, manufacturing statistical process control and reliability.
The E4727B includes software and user interface that is built on top of the PathWave WaferPro Express measurement platform. It has built-in measurement routines for DC characteristics, 1/f noise, random telegraph noise and conducts data analysis. For example, to measure noise on an N-Type MOSFET, the system automatically chooses the source and load impedances that will best expose the intrinsic device noise. Noise data can also be analyzed and represented in device models using device modeling tools such as PathWave Model Builder (MBP) and PathWave Device Modeling (IC-CAP).
