The 53100A from Microsemi is a Phase Noise Analyzer that operates from 1 to 200 MHz. It is used to measure the amplitude, phase, and frequency stability of high-performance RF sources. The device also measures Phase noise and AM noise at offsets from 0.001 Hz to 1 MHz at levels typically below -175 dBc/Hz (10 MHz floor). It features single or dual reference oscillator inputs that allow cross-correlation measurements and doesn’t require phase-locking or measurement calibration. This analyzer makes fast yet accurate single sideband (SSB) phase noise and Allan deviation (ADEV) measurements at a fraction of the cost of alternate solutions.
The 53100A enables a variety of configurations by allowing up to three separate devices to be tested simultaneously using a single reference, enabling a higher capacity for stability measurements. It provides flexibility by allowing an input reference device to be connected through the front panel at a different nominal frequency than the device under test – allowing a single reference to characterize a variety of oscillator products.
The analyzer helps research and manufacturing engineers make precise and accurate measurements of frequency signals, including those generated by atomic clocks and other high-performance frequency reference modules and subsystems. This RoHS-complaint analyzer is available in a bench-top unit that measures 13.5 x 8.5 x 3.6 inches with Type-N, SMA (F), USB-B, and 2.1 mm connectors for front and rear panels. It has designed for engineers and scientists who rely on precise and accurate measurement of frequency signals generated for 5G networks, data centers, commercial and military aircraft systems, space vehicles, communication satellites, and metrology applications.
