SmartMatrix 1500XP

SmartMatrix 1500XP

FormFactor Inc.

50 um Probe Card 125 MHz to 200 MHz

50 um

DDR3, DDR4, LPDDR3, LPDDR4, GDDR5, GDDR6, HBM, HBM2 with 2Hi, 4Hi, and 8Hi stack, KGD (known good die) and KGS (known good stack) test up to 3.2 Gbps Next-generation and emerging DRAM memory devices

Higher parallelism, higher test efficiency, and lower cost of test by using Advanced TRE technology (ATRE), Excellent contact stability and electrical performance to optimize yield, Superior thermal operation to shorten soak time and improve scrub perform

125 MHz to 200 MHz

= 0.5 O(Power path resistance), = 0.1 O(Ground path resistance), = 10.0 O(Signal path resistance), = 2.0 O(Low resistance path signal path resistance)

1200 to 1600 mA(Continous Current), 2500 mA(Pulsed Current)

-40 to 165 Degree C

50 um

500 mW(Power Dissipation)