The ANT-DPP from NSI-MI Technologies are RF Probe Systems that are designed for near-field antenna measurements from 1.1 to 40.0 GHz. They have typical probe pattern correction coefficients for PNF and SNF measurements. These probes provide a gain of 9.0 dBi and have a VSWR of less than 2.5:1. The dual-linearly-polarized probes provide a port-to-port isolation of more than 35 dB and a cross-polarization discrimination of better than 35 dB. Each probe in this system covers a typical half-octave frequency band aligning with the standard waveguide bands. They utilize a circular aperture that is ideal for spherical near-field measurements and has a knife-edge on the aperture to minimize backscatter in planar near-field measurements.
The ANT-DPP probes provide high-accuracy calibration and include standard absorbers and a mounting cage that is compatible with most NSI-MI positioners. They ensure broad, stable beam widths during the measurement phase. These probe systems are available in housings with N-type (female) and 2.92 mm (female) connectors and are ideal for phased array testing, near-field antenna measurements, radome testing, general antenna testing, satellite antenna testing, and wireless applications.
