GaN power transistors are the building blocks of change for the design of a new generation of smaller, lower cost, more efficient power systems – free from the limitations of yesterday’s silicon.
Over the past several years, power engineers have demonstrated that systems designed with GaN power transistors exhibit high efficiency and power density due to GaN’s superior switching performance. One characteristic that continues to draw attention from academia and industry is dynamic RDS(on) performance of GaN devices.
In this webinar, the following topics are discussed:
- The testing methods suggested to establish GaN’s reliability and effective.
- Quantitative analysis of RDS(on)
- Conduction loss equation based on two factors kTj and kdr is analyzed
- A system-level loss breakdown is conducted to show the percentages of each loss mechanism for GaN power transistors
- Conclusion: Dynamic RDS(on) is not a significant loss factor in power system design.
Speaker: Ruoyu (Roy) Hou
Power Electronics Application Engineer, GaN Systems Inc.
Dr. Ruoyu (Roy) Hou is a Power Electronics Application Engineer at GaN Systems Inc. He received his M.S. degree from the Illinois Institute of Technology, Chicago, IL, USA and his Ph.D. degree from the McMaster University, Hamilton, ON, Canada, both in electrical engineering.
Formerly an electrical engineer with GE Transportation, Dr. Hou was a post-doctoral research fellow at McMaster Automotive Resource Centre (MARC), a Canada-based Excellence Research Center. His interests include power electronics, modeling and loss analysis of wide-bandgap (WBG) semiconductor devices, and GaN-based high-power converter and its magnetic design.
Dr. Hou was a recipient of the ECCE Best Paper Award in 2016 and a co-recipient of the Chrysler Innovation Award for the Automotive Partnership Canada (APC) project in 2014.
Moderator: Jason Lomberg
North American Editor, Power Systems Design
Jason Lomberg has been in the industry for nearly a decade. Prior to joining Power Systems Design as their North American Editor, Jason was the Digital Editor at Electronic Component News for seven years.
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