Learn about the wafer test challenges of high-voltage/high-current devices

New generations of 5G devices can have dozens of RF channels operating at high frequency, creating a need for a greater on wafer test volume. In engineering, more device tests are needed to support the expanded speed bands, increasing the workload to complete testing. How can test engineers manage the load? What if the probers could operate unattended -- start a test and measure during a whole shift, overnight, or even over the weekend? There is a real, hands-free solution that provides fast, accurate measurements with high throughput -- leading to more accurate design models and faster time to market

Our Speakers:

Suren Singh
Keysight

Gavin Fisher
FormFactor

In this webinar, you will learn:

• Automatically perform wafer and die soaks to get the probes quickly to consistent operating temperature
• Quickly and automatically clean probes and then calibrate at mow frequencies without user input
• Adjust automatically to multiple probe-to-probe spacings for different device geometries in a single test run
• Monitor calibration drift and recalibrate on the fly when necessary
• Work seamlessly for full temperature range-60 to 175C operation using N5291A Solution, from Keysight technologies, providing single sweep operation of 900 Hz to 130 GHz, and beyond this using Virginia diodes Waveguide mini modules and waveguide probes.