Integrated Test Solutions for 5G, Data centers, and High-speed Test Applications

The rapid expansion of connected devices and data-intensive applications is driving the growing demand for highly efficient and adaptive high-performance computing solutions. Mobile devices such as cell phones, tablets and car infotainment systems have the most sophisticated System-on-Chip (SoCs) ever produced. Testing these devices in full functionality requires comprehensive understanding of the impact the interconnect has on the signal path to address high speed signaling and critical device power requirements. Beyond these requirements, how to ensure these SoCs to function with exceptional reliability and accuracy?