Key Measurements for Half Bridge and Gate Driver Waveforms

The faster switching transitions on modern power devices has made measuring and characterizing a considerable challenge, and in some cases, near impossible. IsoVu technology from Tektronix allows designers to accurately measure half bridge and gate driver waveforms that were previously hidden. During our live webinar, you will learn:

How to overcome measurement challenges on gate drivers and half bridges
Common sources of measurement error
Why a probe’s poor common mode rejection can cause misleading and useless measurements
How IsoVu technology has created opportunities in CMTI, ESD testing, and the double pulse test
Speaker:

Wilson Lee
Technical Marketing Manager
Tektronix

Wilson Lee is Technical Marketing Manager at Tektronix. Wilson has over 25 years of technical marketing, technical sales leadership roles with manufacturers such as CTS Electronic Components, as well technical/value-add distributors such as Richardson RFPD and Premier Farnell. Wilson has focused heavily on design and design engineer engagement within the RF/Wireless, Industrial Power, and Industrial Automation market segments.

Wilson earned his Bachelors of Science Degree at Cornell University. He has lived in New York, Chicago and Asia through his career and currently resides in Portland, Oregon.