Alternatives for Measuring Linearity of 5G and Radar GaN Devices

This webinar will examine alternatives for measuring linearity of GaN devices. It will include an overview of the growing number of 5G and radar GaN-based component applications. This will be followed by a review of the key performance characteristics which need to be measured, focusing on linearity and efficiency. Intermodulation distortion, noise power ratio, and crest factor measurements will be compared as tools to measure and express amplifier linearity. A demo will be provided to conclude.

Presenter Bios:

Walt Strickler is VP and General Manager of Boonton Electronics, a wholly-owned subsidiary of the Wireless Telecom Group. He is a seasoned veteran of the test and measurement industry with previous experience at Anritsu, Giga-tronics, Bird Technologies, and Keithley Instruments. Prior to that, Walt worked at the NASA Glenn Resarch Center focused on microwave communications. In addition, Walt has a BSEE and an MBA. 

Matthew Diessner is Director of Business Development for Boonton Electronics and Noisecom, wholly-owned subsidiaries of the Wireless Telecom Group. Before electronics Matt was a Respiratory Therapist where he found his passion for electronics and switching careers. Matt started working with Boonton Electronics back in the late 70’s. He has worked and learned while at GE, Tektronix, Anritsu, and Transistor Devices before returning to Wireless Telecom Group 14 years ago. Matt has Industrial Electronics Certification from R.E.T.S, ASE in RF Technology.