Understanding Pulsed-RF Using Time-Selective Spectrum Analysis

When performing measurements on pulsed RF-based transmitters, used typically in TDMA-based communications, radar and electronic warfare systems, the signal of interest will only be available to analyze at an instant in time, either periodically or randomly depending on the nature of the signal. This creates many measurement challenges, one of which is the sin(x)/x spectral effects of the pulse-masking modulation, or interference measurements. Another is the management of instrument memory and measurement time when there is no signal in the off period of the transmission.

Time-selective spectrum analysis is a measurement capability that provides spectral information about signals in the frequency domain that are separated in the time domain, typically pulsed-RF signals. In this webinar we will look at the benefits of time-selective measurements, and compare various measurements, instrument architectures and triggering techniques that can be utilized for deeper insight than what is provided through traditional spectrum analysis.

Speaker:

Mark Elo,

Sr. Technical Marketing Manager, Tektronix

Mark Elo is a senior technical manager at Tektronix. He began his career as a design engineer in Hewlett-Packard's Microwave Division in 1990 and has since held various senior management positions at Agilent Technologies, Anritsu, Gigatronics and Keithley instruments in R&D, Marketing and Business Development. Mr. Elo has more than 25 years of test and measurement experience in RF and microwave instrumentation.