EDI CON Online: 5 Challenges of 5G Wideband Test

5G presents unique test challenges to engineers having to test RFICs that operate on wider, highly complex 5G waveforms using new spectrum below 6 GHz and at millimeter wave frequencies.  Engineers also face new device architectures like hybrid beamformers, and new test requirements for integrated devices like Antenna-in-Package (AiP) with lengthy over-the-air (OTA) test plans. This presentation introduces the characteristics and challenges of testing new 5G RFIC devices, and presents solutions for fast characterization, validation, and manufacturing test.

Presenter Bio:
Alejandro Buritica serves as a senior semiconductor solutions marketer at NI and works closely with many different types of customers on the latest solutions for testing RF semiconductor devices in the lab. His job functions include identifying industry trends, engineering faster and more cost-effective test solutions, and educating customers on best semiconductor validation test practices. Alejandro’s areas of expertise include RF measurement techniques, test architectures, and best measurement practices for mobile and wireless connectivity devices. 

With more than 13 years of experience at NI, Alejandro has served in multiple roles throughout his career including R&D design validation, RF systems engineering, and product marketing for automated test and RF instruments. 

Alejandro holds a Masters degree in Wireless Technologies from Politecnico di Torino, Italy.