Very-Near-Field Scanning Solutions for Pinpoint Diagnosis of EMC Compliance Problems

EMC chambers are not the best tool to use for debugging when a device fails compliance tests or to diagnose root causes of failures. Systematic problem isolation of components can be effective but it is slow and does not always deliver a resolution. The array-based very near field scanning technique developed by EMSCAN brings real-time evaluation of the spatial distribution of emissions to problem solving. A new method that combines the array of sensors with mechanical motion provides the fastest high resolution scanning available and allows designers to peer inside the IC. Test results from this new system on real world ICs and an application showing how the spatial distribution of emissions can be used to solve problems will be presented.

Presenter bio: 
Ruska Patton is responsible for the evolution of EMSCAN's real-time near field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in electrical engineering from the University of Saskatchewan. During his time at university, he was recognized with numerous IEEE awards and a distinguished research scholarship.