Using Protocol Aware Tools to Simplify Program Development for RF SOC Test
High Frequency Electronics, Teradyne, Inc.
Developing an ATE production test solution for today’s complex RFSIP/SOC devices has been an increasingly difficult task. Most of the typical RFSIP/SOC devices are multi-band and in most cases multi-function. Test requirements have moved away from simple RF parametric tests (like: Gain, Noise Figure, S-Parameters) and have moved toward system level testing including modulation. With new enhanced device capability and system level test requirements, today’s typical RF ATE test program is substantially more challenging and is more time consuming to develop. Test engineers are always under great pressure to deliver a solution on time with overall Cost-of-Test (COT) that is better than the previous device.
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