Improving Test Times with Fast Frequency, Amplitude and Waveform Switching
Pressure to reduce test costs and increase through-put continues to rise in RF automated test envi-ronments (ATEs). One way system designers look to manage costs is to reduce test times. This is commonly done by eliminating unnecessary tests; however, this is becoming increasingly difficult in an industry where more and more functionality is integrated into wireless sys-tems, requiring more tests with more setups and more conditions.
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