A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz

This paper presents a new measurement method based on the parallel plate capacitor concept, which determines complex permittivity of dielectric sheets and films with thicknesses up to about 3.5 mm. Unlike the conventional devices, this new method uses a greatly simplified calibration procedure and is capable of measuring at frequencies from 10 MHz to 2 GHz, and in some cases up to 6 GHz. It solves the parasitic impedance limitations in conventional capacitor methods by explicitly modeling the fixture with a full-wave computational electromagnetic code. Specifically, a finite difference time domain (FDTD) code was used to not only design the fixture, but to create a database-based inversion algorithm. The inversion algorithm converts measured fixture reflection (S11) into dielectric properties of the specimen under test. This paper provides details of the fixture design and inversion method. Finally, example measurements are shown to demonstrate the utility of the method on typical microwave substrates.