Characterizing Uncertainty in S-parameters Measurements
- Author:
Tekamul Buber, Pragti Narang, Giampiero Esposito and Sathya Padmanabhan
As technologies evolve and requirements become more challenging, implementing processes that increase confidence in measurements and ensure accurate and reliable characterization—and product performance— are critical. Characterizing and quantifying measurement uncertainty is one such process to achieve the desired results. Uncertainty can aid in definitively verifying a VNA calibration before measuring a DUT. Uncertainty can help understanding how the various components in a measurement system impact the overall uncertainty of the DUT measurement. Identifying, quantifying and reducing the major sources of uncertainty in a test setup will improve the accuracy of the overall measurement. Referring to the original amplifier scenario shown in Figure 1, quantifying measurement uncertainty can provide the confidence that the true performance of the DUT is reflected in the measurements, and the design will not pass one test and fail another.
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