RF Probes & Systems
RF probes & systems are used for semiconductor device & wafer testing in universities and research labs for DC, RF, and microwave testing & measurement. Numerous testing & measurement products are available which include RF probes, probe cards, probe positioners & manipulators, probe stations & systems, and much more products.
RF Probes: RF probes are devices used to measure RF signal in an electronic circuit. These probes are important tools used by R&D and quality assurance engineers for RF & microwave circuit testing and troubleshooting. Typically, an RF probe is a circuit for testing equipment that converts high-frequency RF signal into DC voltage. Then this DC voltage is measured by the testing instruments. These probes are suitable to use with any measurement equipment such as spectrum/network, signal analyzers, oscilloscopes, frequency Counter, etc.
Probe Cards: An RF probe card is a PCB (printed circuit board) with metallic or other material contacts. It is used in wafer testing for providing electrical contacts between the test system & circuits on the wafer. These probe cards are available with features such as excellent signal integrity, minimum contact resistance, repeatable results, high test efficiency, minimum contact force, field-adjustable planarity, and low cost.
RF Probe Stations and Systems: RF probe stations and systems are used for semiconductor device & wafer testing in universities and research labs for DC, RF, and microwave testing. They have much use throughout R&D, product development, and failure analysis where engineers need a flexible yet precise tool to conduct a range of tests on different areas of a device. Probe stations & systems are available in manual, semi-automatic, and automatic options.
