Probe Stations & Systems

47 Probe Stations & Systems from 8 manufacturers listed on everything RF

Probe Stations & Systems for RF and mmWave applications are listed here. Narrow down on the probe stations and systems based on your requirement. View product details, download catalogs and get quotes on the products you need.

Description:150 mm RF Probe Station
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck Travel Range:
152.4 x 152.4 mm
Microsope Movement Range:
2 x 2 Inches
more info
Description:Autonomous Wafer Probing System for RF and mmWave Measurements
Type:
Automatic
Frequency:
Upto 500 GHz
more info
Description:300 mm Manual Probe System
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck Travel Range:
325 x 325 mm
Chuck Travel Resolution:
1 µm
Microscope Travel Resolution:
5 µm
Microsope Movement Range:
2 x 2 Inches
Connectors:
BNC, BNC - Female
more info
Description:200mm High Performance Manual Probe System For Reliable and Accurate RF-mmW, DC/CV, and High Power Test Measurements
Type:
Manual
Frequency:
Up to 110 GHz
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
38.1 mm
Chuck Travel Range:
205 x 205 mm
Chuck Travel Resolution:
1.5 to 14 µm
Microscope Travel Resolution:
2 µm
Microsope Movement Range:
2 x 2 Inches
Connectors:
BNC, BNC - Female
more info
Description:Semiautomatic probe system
Type:
Automatic
Chuck Size:
300 mm
Chuck Travel Range:
305 x 305 mm
Chuck Travel Resolution:
0.1 µm
Microscope Travel Resolution:
0.5 µm
Microsope Movement Range:
15 mm
more info
Description:4 x 6.5 Inches RF Probe Station
Type:
Manual
Measurements Type:
RF
more info
Description:Easy-to-use 20 GHz RF Probing Solution
Type:
Manual, Semi Automatic
Measurements Type:
RF
more info
Description:Manual Probe Station
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
11 to 200 mm
Chuck Travel Range:
11 to 200 mm
more info
Description:150 mm RF Probe Station
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck Travel Range:
152.4 x 152.4 mm
Microsope Movement Range:
2 x 2 Inches
more info
Description:220 GHz Probe Station for On-Wafer Characterization of 5G/6G Devices
Type:
Automatic, Manual
Frequency:
170 to 220 GHz
more info

What is RF Probe Station?

RF probe stations are used for semiconductor device and wafer testing in universities and research labs for DC, RF, and microwave testing. They are used extensively for R&D, product development, and failure analysis where engineers need a flexible yet precise tool to conduct a range of tests on different areas of a device. Probe stations are available in manual, semi-automatic, and automatic options.


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