NOFFZ Technologies has developed a new IoT Test Node (ITN) - a simple, cost-effective, and functional tool to test RF functionality of IoT devices and automotive wireless connectivity modules. With this new test tool, IoT wireless interfaces can be effortlessly tested right from the validation stage in the lab: Wireless connections using digital radio technologies like Wi-Fi, Bluetooth, UWB and V2X can be tested in specific scenarios.
For example, the IoT Test Node (ITN) can generate Bluetooth 5.2 and Wi-Fi 6E signals, simulating a smartphone. This virtual smartphone can also provide the precise radio environment for testing and characterizing connectivity modules in the center console of a car. Most importantly, the system was developed for automated end-of-line testing of Wi-Fi, BT, UWB and V2X interfaces in industrial production. A software is provided for a serial run of these tests, with the help of which, the ITN can be easily integrated into an automated test system.
The small IoT Test Node can be used very flexibly due to its small size. With its extensive functions for establishing Bluetooth and Wi-Fi connections, coupled with analog and digital inputs and outputs for simple measurements, control commands and flash jobs, the ITN is designed for efficient, cost-effective pass/fail testing. Overall, the ITN ensures an error-free test environment. Its easy-to-use graphical user interface makes every test engineer's job much easier.
Currently, further variants of the IoT Test Node are under development and will form a separate ITN test device series in the future, probably consisting of three different products. Another tool for simulating UWB tags, such as a car key, is planned, which will allow reliable testing of UWB anchors.
With the IoT Test Node, NOFFZ has succeeded in providing an efficient addition to its product family of test equipment and emulators for connectivity devices. The ITN offers an entry point into this portfolio and is positioned in the hierarchy before the established NOFFZ Base Station Emulator UTP 5018 and the NOFFZ Universal Wireless Tester, which enable, among other things, individual mobile radio environments and detailed non-signaling RF measurements.
All components can be completely assembled in a suitable test rack as required but are also available separately. As a product family, all devices cover the complete spectrum of test cases in the RF domain: simple pass/fail tests, detailed functional tests up to parametric analyses.
The new IoT Test Node will be shown for the first time at electronica 2022 in Munich Hall A3/Stand 425 from 15-18 November.
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