Anritsu has introduced the MT8821C Radio Communication Analyzer, an all-in-one RF tester with the widest capability for supporting LTE-Advanced (LTE-A), as well as all other adopted technologies. This integrated, simple, accurate instrument can lower the cost of test and speed time to market. This next-generation Radio Communication Analyzer leverages the award-winning MT8820C platform, used worldwide by developers of 2G/3G and LTE UEs and chipsets. It is backwards compatible with the MT8820C and maximizes the value of previous investments and reduces the cost of configuring automatic test environments that have featured the MT8820C.
With eight transmitter ports and two receiver ports, a single system will perform LTE-Advanced Carrier Aggregation (CA) with up to four Component Carriers (CCs) using 2 x 2 MIMO, as well as two Component Carrier aggregation (2CCs) in the uplink. A built-in RF combiner simplifies configuration of complex test environments for LTE-A CA, while reducing test environment calibration procedures.
The MT8821C supports 2G to 4G wireless tests, making it a cost-effective single-instrument solution to validate co-existing UEs integrating multiple technologies. As well as supporting LTE-A, the all-in-one MT8821C operates as network simulator supporting LTE, W-CDMA/HSPA, GSM/GPRS/EGPRS, TD-SCDMA/HSPA, and CDMA2000® 1X/1x EVDO technologies. Covering 30 MHz to 6 GHz, it can conduct RF TRx tests in compliance with the 3GPP and 3GPP2 standards, as well as parametric and functional tests such as maximum throughput.
Mobile device testing is drastically simplified with the easy-to-operate MT8821C. Preset measurement parameters for test items specified by the 3GPP RF test standards eliminate set up and operation errors. Additionally, engineers can establish and change test parameters easily using a new highly advanced Graphical User Interface (GUI) that is accessed through a large 8.4-inch touch screen unique to this instrument class. An advanced parameter search function enables complex user test settings to be quickly and reliably configured, and automatic PASS/FAIL of measured results according to test specification shortens test times for greater cost efficiencies.
Anritsu’s patented Parallelphone™ Measurement feature can be integrated in this test system to further reduce test time and control test costs. With the capability, two mobile devices can be tested simultaneously and independently by a single analyzer, cutting test times in half.
