Anritsu will be conducting five technology workshops at this years EuMW 2015 in Paris, France on 9th September. The workshops will focus on Anritsu's leading Vector Network Analysis techniques and technologies. They will take place in meeting room 101/102, level 1. An overview of the different workshops can be seen below:
1. Compact E-Band VNA with Reduced Complexity
Nonlinear transmission line technology enables compact millimeter-wave VNA architectures with enhanced performance and flexibility. We will discuss these architectures in the context of E-band measurements, and show that the resulting systems reduce complexity and enhance efficiency in a variety of measurement scenarios. Click here to sign up.
Start Time: 10:00
Length: 40 minutes
2. 5G Measurements using a VNA including Error-corrected Modulated Carrier Analysis
5G wireless systems will provide high data rate with maximized carrier efficiency. Ideally, measuring the efficiency of a 5G network system, subsystem, and components is best when a calibrated VNA can be used to analyze active devices stimulated by a modulated carrier. Modulation rates of 5G systems are expected to be 200 MHz and higher. This workshop describes how a modulated carrier signal with up to 200 MHz modulation rate can be captured by a calibrated VNA and provide corrected display of the frequency spectrum. Click here to sign up.
Start Time: 11:00
Length: 40 minutes
3. Measuring IMD Properties of Active Devices Using a High Performance IP3 Receiver for Improved Accuracy
Intermodulation distortion (IMD) has become an important measurement during the design of RF and microwave amplifiers. This workshop discusses the different configurations available in a VNA for setting up accurate IMD measurements, including the ability to perform single-connection S parameter and IMD measurements without the need for external sources or combiners. Click here to sign up.
Start Time: 13:00
Length: 40 minutes
4. Performing On-wafer 145 GHz 0.8 mm connector Differential VNA Measurements with a Single Connection
Differential devices are becoming more common as communication system demands and performance requirements continue to rise. This workshop discusses the different system architectures available for differential on-wafer measurements and the advantages of tightly integrated VNA architecture for improved system dynamic range and measurement stability. Click here to sign up.
Start Time: 14:00
Length: 40 minutes
5. ShockLine VNA based Planar Near-Field Measurement System (PNMS) systems
NFS measurement systems can be realized with relatively low material costs since they neither need as much room as a comparable far-field system nor require custom-made mirrors as this is the case for compact ranges. This workshop explains and benchmarks the general working principle of an inexpensive PNMS. We will discuss PNMS issues and weaknesses, and approaches to resolution. Click here to sign up.
Start Time: 15:00
Length: 40 minutes
