Accel-RF Instruments has “unplugged” the RF SMART Fixture from their automated test platform and made it available for bench-top testing. The Quantum-SMART enables concurrent testing for reliability validation, performance-characterization, and product qualification through RF-biased burn-in and product functional testing.
The Quantum SMART fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing independent pulsed-bias and pulsed-RF signals to a device-under-test (DUT) or remote subsystem. The signals are controlled from a user-interface compatible with Accel-RF”s LIFETEST software. The fixture is capable of “active” temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor.
Unplugging the SMART Fixture from our accelerated life-test platform for use on a benchtop allows for a quantum reduction in the traditional semiconductor technology development roadmap. Implementing Accel-RF’s Quantum SMART solution provides both accelerated and enhanced return on investment (ROI) by launching products into the market at a much faster pace. The streamlined productivity of this test solution is crucial for rapid insertion of the new generation of Gallium-Nitride (GaN) and Silicon-Carbide (SiC) compound semiconductor technologies envisioned in key commercial and military market sectors.
