Langer EMV-Technik, a company that is at the forefront of research, development, and production in the field of EMC, has introduced P512, an RF probe set that is designed for direct power injection (DPI) and measurement to test PCB boards and IC pins. The P512 is capable of coupling RF power up to 12 GHz directly into the IC pins without requiring complex test setup. A special contact system with a large-ground connection is also used for this purpose. This probe’s cut-off frequency of 12 GHz was measured using an IC stripline within the ground system to characterize its performance.
Why DPI Measurements are Required
The weak points for the susceptibility to interference in modern electronics often lie in the circuits (ICs) of the assemblies. However, the increasing integration density and smaller semiconductor structures in the ICs also change their interference behavior. Fast and high-frequency interference, which was compensated for in ICs of older generations by the larger structures or did not become effective due to the high inductance of the longer interference current paths, is becoming increasingly relevant for new types of ICs. To test an IC for its susceptibility to interference from high-frequency signals, RF power can be fed directly (DPI) into the pins in a conducted manner.
This method of directly feeding RF power (DPI) into IC pins is generally carried out using a test PCB in accordance with the standard (IEC 62132-4). According to the standard board, each pin to be tested is provided with a coupling capacitance of 6.8 nF and a subsequent RF-compatible connector (e.g. SMA). By connecting a power amplifier to the connectors, RF power can be fed directly into the pin. The upper limit frequency up to which such a DPI test is carried out is 1 GHz. In the automotive sector, tests are carried out up to 3 GHz.
For DPI tests for ICs with more than 100 pins, the design of the test PCB quickly becomes complex and confusing. In this case, either a small number of pins that are considered relevant are tested or several test PCBs are designed, on each of which different pin groups can be tested.
The main advantage of using the P512 is the reliable frequency extension to 12 GHz for the coupling of RF power. ICs manufactured using flip-chip technology and housed in a BGA package are particularly susceptible in this higher frequency range. Further advantages result from the design of the sample in combination with the ground system included in the set. The IC pins no longer have to be contacted separately via the SMA connector of the respective pin in order to couple in RF power; instead, the probe itself is connected to the power amplifier with the SMA connector on the back of the probe. The pins are then contacted using the tip of the probe, which can be flexibly positioned on each pin of the IC. This eliminates the need to switch between testing two pins and makes it possible in principle to automate the measurement. The 6.8 nF coupling capacitance is located inside the probe and no longer needs to be taken into account when designing the test PCB.
Using P512 as HF Probe Head
The P512 can also be used as an RF probe for measuring high-frequency signals up to 12 GHz. The measurement takes place in the same ground system as the coupling. The advantage of flexible contacting of any pins, as already mentioned for coupling, is therefore retained. Due to the ground contact of the sample directly next to the measuring tip, potential coupling loops remain minimal, which leads to increased freedom from feedback in the measurement. When measuring high-frequency useful signals, the signal may be capacitively loaded and distorted by the 6.8 nF. In such cases, the internal coupling capacitance of the probe can be flexibly adjusted to any value in the pF range.
Key Features of the P512 RF Probe Set
- High power coupling of 2 W at 12 GHz
- Comparable measurement results through a reliable coupling network
- High-frequency measurements up to 12 GHz
- Low loss factor: less than 3 dB at 12 GHz
- VSWR less than 2
Applications of the P512 Set
- DPI measurements on each IC pin up to 12 GHz
- RF measurements on each IC pin
- Usage as a probe head (coupling network)
A Unique EMC Experimental Seminar by Langer EMV-Technik
Langer EMV-Technik will be hosting a unique practical EMC experiment seminar for 2 days. Attendees will be able to learn all about the latest developments in the field of electromagnetic compatibility and how you can avoid interference in electronic devices over the course of 2 seminar days. Langer’s experts will share their knowledge in practical experimental seminars and case studies. Each participant is given the opportunity to apply the freshly learned tricks and tips themselves at a training location and can check their success immediately. At the end of this seminar, the knowledge will enable customers to develop EMC-compliant projects by themselves.
Due to the high number of inquiries and the fact that some seminars for the second half of 2024 are already fully booked, the company is offering two additional dates for English version, which are,
- SF1 (12/13.11.2024)
- SA1 (14/15.11.2024)
Furthermore, Langer EMV-Technik will be introducing a new product in the future, Troublestar TS 23, which is an application practical example that illustrates the concept of ESD interference suppression. The example uses ESD generator (ESD gun) to expose the assembly over a large area and does not allow the weak points on an IC to be located. A lot of time is wasted on trial and error. If the tip of the ESD gun is placed on the left-hand metal component of the test object (network socket) and the gun head is swung downwards onto the test object, the processor will malfunction (display failure). The above figure shows the illustration.
The fault location cannot be narrowed down any further with the ESD gun. Now it is traditionally necessary to continue working by trial and error. Based on assumptions, various countermeasures are added and tested until success is achieved.
Click here to learn more about the P512 RF probe set.
