The PCTEST Engineering Laboratory has acquired LTE data throughput test capability for the Anritsu ME7834L Mobile Device Test Platform (MDTP). Through this acquisition, RFT 113 Performance Test capability will now be available to support the wireless device ecosystem. Additionally, RFT 113 data throughput tests installed on the ME7834L include both static and dynamic fading configurations across multiple LTE bands, with more than 60% of the test cases verified by PTCRB. Initial static tests were approved for release in September 2015, as the dynamic fading tests in RFT 113 are forecast to accelerate in early 2016 with their expected addition to the PTCRB certification requirements.
The ME7834L MDTP is a scalable GCF, PTCRB, and carrier-validated test system that enables certification of LTE devices to industry and carrier standards. The test system provides test coverage for 3GPP 36.523 and 37.901, as well as a wide portfolio of CAT test plans, including leading eMBMS coverage for a large North American operator. The ME7834L, along with its sister test platform ME7834LA, provide industry-leading LTE-Advanced coverage, including 2CA and 3CA test cases for both inter- and intra-band CA with MIMO.
PCTEST Lab is a leading independent test laboratory offering one-stop conformance, performance, and regulatory testing of wireless devices in accordance with industry and 3GPP/3GPP2 technical requirements, including RF, Protocol, RRM, Carrier Aggregation (CA) and carrier-specific test plans. PCTEST Lab is an approved CA & VoLTE Lab, LTE/CDMA Safe-For-Network (SFN) Lab, an Open Development Lab, an OTA Antenna Performance Lab, as well as an A-GPS test facility for major U.S. carriers including GCF and PTCRB certifications.
