Keysight Technologies has announced their first PXI Express source/measurement unit, built for design validation and production test of next-generation power amplifiers and front-end modules supporting cellular and wireless connectivity formats.
This high-speed M9111A changes voltage, stabilizes and accurately measures micro-Amps, all in less than 1 ms. The PXIe entry achieves speeds 20 times faster than those for previous-generation, stand-alone SMUs at a fraction of the size.
In power amplifier automated test environments, speed of test is critical. The M9111A addresses this challenge. Its high-speed output and glitch-free operation, combined with the ability to remain stable, even with capacitances up to 150 µF, make it ideal for power-amplifier test of handsets and cell phones.
Power amplifiers draw rapid pulses of current, a challenge that this unit easily manages with transient performance unmatched in the industry. Its SMU (Source/Measure Unit) dramatically reduces voltage droop due to pulse loading and recovers quickly to its program voltage.
Under extreme, dynamic load conditions, traditional SMUs may prove unstable. This unit provides industry-leading output stability, eliminating the worry that the power source will interfere with measurements. Glitch-free operation ensures safe use with the device under test during output and measurement range changes, even with high capacitances. The output voltage and current remain steady and the DUT undamaged.
This one-slot, two-quadrant PXIe module delivers up to 18 W of power at up to 13 V, ±1 A or up to 6 V, ±3 A. It combines the capabilities of a voltage source, a current source, an ammeter and a voltmeter.
Measurement capabilities for the M9111A include:
- High-speed changes in voltage with fast settling times
- High-speed recovery and low-voltage drop when the DUT pulls pulses of current with sharp edges
- High-speed, accurate low-current measurements, such as leakage currents
This measurement unit is part of Keysight's RF power amplifier and front-end module reference solution, which enables rapid, full characterization of next-generation power amplifier modules, such as power amplifier devices, including S-parameter, demodulation, power, adjacent channel power and harmonic distortion measurements.
