Agilent Technologies Inc. will demonstrate 25 of its newest design and measurement solutions at the IEEE MTT-S International Microwave Symposium (Booth 1230),June 2-7, at the Washington State Convention Center in Seattle.
The demonstrations will cover everything from circuit-level modeling though system verification for general RF, microwave, 4G communications and aerospace/defense.
Agilent business partners’ solutions will include modeling and device characterization, semiconductor foundries, wafer, IC and circuit board measurements and prototyping, antenna measurement systems and test chambers. In addition, Agilent will present several technical programs and workshops.
Dr. Gordon Strachan, the lead architect for the hardware control software in Agilent’s X-Series signal analyzers, will present his keynote address, “Modern RF Measurements and How They Drive Spectrum Analyzer Digital IF Processor Design,” on Wednesday, June 5, at 11:10 a.m. in the MicroApps Pavilion.
Visit Agilent Technologies at Booth #1230.
