W. L. Gore & Associates has expanded the functional frequency range of its FF series - VNA Microwave/RF Test Assemblies, to 70 GHz. This upgrade addresses industry requirements for enhanced performance in the 60 - 70 GHz range where there is increased need to maintain measurement accuracy, especially in Vector Network Analyzers (VNAs), Communication Testing, and mm-Wave applications.
Constant and/or highly repetitive movement of cables can compromise the measurement precision of high-performance VNAs. Leading manufacturers such as Keysight and Rohde & Schwarz choose GORE VNA Microwave/RF Test Assemblies because of the improved performance and reliability they see with their equipment.
GORE VNA Microwave/RF Test Assemblies maintain excellent insertion loss and VSWR. Unlike conventionally designed RF test assemblies, Gore’s assemblies ensure accurate and repeatable measurements because of their excellent phase and amplitude stability with flexure. And prior to shipment, all VNA Microwave/RF Test Assemblies are tested for return loss, insertion loss, phase stability, and loss stability up to their maximum operating frequency.
Constructed with an abrasion-resistant polymer braid around a flexible armor casing, these VNA Microwave/RF Test Assemblies are extremely durable. They withstand crush forces of more than 800 pounds force/inch and have an auto-limiting bend radius of 2.25 in (57.2 mm). Even with this armored and rugged construction, they maintain excellent flexibility, which increases the cable’s life.
These VNA Microwave/RF Test Assemblies include NMD-style ruggedized connectors for direct attachment to VNA test ports and allow the use of test port-compatible adapters for best durability and stability. The combination of the assembly’s ruggedized construction and NMD-style connector ensures longer flex life with consistent performance and reduced frequency of recalibration.
The new 70 GHz GORE VNA Microwave/RF Test Assemblies are in production now. For more information, click here.
