Agilent Technologies Inc. announced it will demonstrate the latest wireless test and measurement solutions at CTIA WIRELESS 2010, March 23-25, Las Vegas Convention Center, Booth 2427. Agilent's test solutions address the latest wireless technologies, including LTE, TD-LTE, 3GPP W-CDMA, HSPA+, E-EDGE (EDGE Evolution), UMA/GAN, WiMAX(tm), and femtocells.
CTIA WIRELESS 2010 is the premier event for all things wireless. While testing mobile devices, diagnosing infrastructure, and optimizing networks are hidden from consumers, they are critical success factors for wireless manufacturers and operators. Helping the wireless industry deal with the most advanced technologies and standards is a must for test and measurement vendors and a critical factor in the efficient delivery of new capabilities to the consumer. Agilent's test and measurement solutions meet that challenge by allowing engineers in R&D, manufacturing, installation and maintenance to develop and deliver innovative products for current and future demands in the rapidly evolving, hyper-competitive, wireless market.
Agilent will show the following test and measurement solutions at CTIA WIRELESS 2010:
- Agilent's RF Signal Generation & Analysis solutions for 2G-4G. The RF test solution features best-in-class signal generation using the Agilent MXG and PXB for real-time LTE eNB receiver testing and MIMO receiver implementation. Agilent also will show the industry's highest performance signal analyzer, the Agilent PXA, which is ideal for RF transmitter testing of cellular standards such as LTE FDD, LTE TDD, HSPA+, and digital video standards such as DVB-T/H.
- Agilent's Smart Phone and Data Modem Test Solutions. Engineers can test smart phones and wireless devices with a system based on the Agilent 8960 that emulates real users in real networks. This includes testing devices at high data rates such as 21 Mbps HSPA+, and measuring power consumption and mobile device battery life.
- Agilent's Signaling Analyzer Real-Time for LTE (SART) and Agilent's Drive Test products verify and optimize new or trial LTE networks. Agilent SART for LTE helps users design and deploy equipment that meets specification and quality standards; verify, troubleshoot and optimize services; accelerate cycle time; and generate profits faster. New capabilities allow wireless carriers and NEMS to analyze an LTE-enabled ten-fold-plus increase in network traffic without sacrificing real-time-to results. Agilent's Drive Test Solution for LTE phones, includes comprehensive, interactive network performance testing -- throughput, throughput vs. location, carrier-to-interference ratio, MIMO capacity enhancement and channel resource allocation; it can now export results to Agilent's SART for LTE, providing an industry-unique end-to-end solution from a network core to base-stations to mobiles.
- Agilent's N9923A FieldFox RF Vector Network Analyzer (VNA). The N9923A is the world's most accurate handheld VNA and the N9912A FieldFox RF Analyzer is the world's most integrated handheld instrument for wireless installation and maintenance. Agilent's family of handhelds, including the N9340B 3 GHz performance handheld spectrum analyzer and the N9330B 4 GHz low cost handheld cable and antenna tester, will also be shown in the Agilent booth.
Agilent recently received Frost and Sullivan's Best Practices Award for World Market Share Leadership in LTE and WiMAX test equipment. The award is based on market research showing that Agilent held the highest industry market share in 2008 with 20.2 percent of the market revenues.
Agilent has a wide range of hardware platforms and software solutions that address the complex technical issues inherent in wireless communications. These include wider bandwidth, higher frequency, complex modulation and smart antenna technologies. Additional resources include Agilent's book, "LTE and the Evolution to 4G Wireless: Design and Measurement Challenges," a vast library of application notes, and a knowledgeable sales force capable of guiding and supporting customers through complex RF and wireless application challenges.
