Agilent Technologies Inc. is all set to showcase its newest innovations in design and test products for advanced RF and microwave research, development and manufacturing at the 2011 IEEE MTT-S International Microwave Symposium (IMS). The company will be presenting cutting-edge solutions for advanced applications at the three-day event (June 7-9) at the Baltimore Convention Center.
Agilent is the premier measurement company and a technology leader in chemical analysis, life sciences, electronics and communications.Barry Alcorn, Americas market segment manager in Agilent’s Electronic Measurement Groupsaid “For over 65 years, our design and test solutions have provided engineers with the tools they need to accelerate their research, design and development in RF, microwave and now millimetre-wave electronics.”
Agilent will be demonstrating various products at Booth 813 of the International Microwave Symposium 2011. The products on display include innovative design tools like Agilent System Vue and Aglient EMPro software 2011.07. Agilent System Vue, a design platform offers support for ultra-widebrand ARBs and radar applications while the latterdelivers a simulation design platform for analyzing 3-D electromagnetic effects. Additionally on show will be the newest X-parameter breakthroughs, a new category of nonlinear network parameters for high-frequency design and the latest features in ADS 2011.
Other products on display include tools for waveform analysis & characterization, widebrand signal-generation & analysis solutions and nonlinear behavioural analysis solutions, among others. A low-voltage scanning electron microscope will also be demonstrated. It is used for nanoscale imaging of RF devices and RF power measurement solutions for radar pulse measurements analysis. Apart from the demonstrations at IMS 2011, Agilents’s business partners will provide solutions for attendees inmodeling and device characterization, semiconductor foundries, wafer, circuit board measurements, prototyping tools, antenna measurement, systems, test chambers and custom ATE. Agilent will also initiate various technical programs and workshops and also participate in the MicroApps Nonlinear Characterization Expert Forum being held during the event.
