The N5511A is a Phase Noise Test System that operates from 50 kHz to 40 GHz (3 GHz and 26.5 GHz options also available) with offsets from .01 Hz to 160 MHz internally. It can be configured for either single or dual-channel operation and has a high dynamic range. This system can measure phase noise down to kT (-177 dBm/Hz at room temperature), which is the theoretical limit for thermal phase noise floor. The flexible and scalable architecture of this system allows easy integration of external reference sources enabling users to select from a variety of commercially-available low-noise sources.
The flexible and scalable architecture of this system allows easy integration of external reference sources enabling users to select from a variety of commercially-available low-noise sources. The N5511A consists of phase detector and data conversion modules housed in a custom, low-noise single PXIe mainframe four units (4U) high. The system software included runs on an integrated PC controller using the Microsoft Windows 10 operating system.
