The Autonomous RF Measurement Assistant from FormFactor enables autonomous RF and mm-Wave Measurements and calibrations on 200 mm and 300 mm wafer probe stations. The Autonomous RF Measurement Assistant allows less experienced operators to perform an RF calibration up to 500 GHz by simply pushing a button.
This system utilizes FormFactor’s Contact Intelligence which allows the operator to start a test and leave the probe station measuring during the whole shift without any user intervention. Contact Intelligence offers true hands-free and autonomous RF calibrations and measurements over multiple temperatures. It uses newly designed programmable positioners to give the highest positioning resolution for the most accurate and repeatable probe positioning and measurement performance. With 0.3 μm resolutions, even the smallest errors can be recognized and corrected.
Programmable positioners and, probe tip recognition algorithms coordinate with the WinCal XE calibration software to automatically recalibrate if the system performance drifts beyond a usable limit. Probes are dynamically corrected for the most accurate pad placement on-the-fly to compensate for any thermal expansion of the probes or device when changing temperature. This results in testing more devices in a shorter period of time, with a higher RF measurement performance and more accurate design models, and faster time to market.
This Wafer Probing System is ideal for the autonomous calibration and measurement of RF devices for applications such as 5G, autonomous driving, and next-generation Wi-Fi which need to have the most accurate device models for their IC designs.
