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CM300xi-SiPh

Probe Station & System by FormFactor Inc. | Visit website (12 more products)
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The CM300xi-SiPh from FormFactor Inc. is a Probe Station & System with Chuck Size 300 mm, Chuck Travel Resolution 0.2 µm, Frequency DC to 2.5 Hz, Chuck to Platen Height 43 mm. Tags: Manual. More details for CM300xi-SiPh can be seen below.

Product Specifications

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Product Details

  • Part Number
    CM300xi-SiPh
  • Manufacturer
    FormFactor Inc.
  • Description
    300 mm Semi-/ Fully-automated Probe System with Autonomous Silicon Photonics Measurement Assistant

General Parameters

  • Chuck Size
    300 mm
  • Chuck Theta Coarse Travel
    ±3.75 Degrees
  • Chuck Travel Range
    301 x 501 mm
  • Chuck Travel Resolution
    0.2 µm
  • Frequency
    DC to 2.5 Hz
  • Diameter
    305 mm
  • Material
    Nickel, Gold Plated Aluminum
  • Measurements Type
    DC, RF
  • Microscope Travel Resolution
    0.2 µm
  • Microsope Movement Range
    10 mm
  • Connectors
    BNC
  • Type
    Manual
  • Chuck to Platen Height
    43 mm
  • Scope Lift
    0.2 µm (0.008 mils)
  • Weight
    47 kg
  • Operating Temperature
    -60 to 300 Degree C

Technical Documents
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