Probe Test Solutions Ltd (PTSL), an established high-growth company and a global provider of advanced ATE test hardware solutions, has announced its entrance to the RF Probe Card market, with the launch of the first product from a planned family of devices, demonstrating the highest performance signal integrity RF probe card solution on the market. The PhazorRF product family will target next-generation automotive radar, 5G and 6G applications.
"Within 12 months of closing a round of financing and the subsequent acquisition of ThinkMEMS, we are now announcing the launch of the PhazorRF product family and our strategic entrance to the RF probe card market," comments Jordan Mackellar, CEO PTSL. Today, high-frequency RF ICs or complex System on Chip (SoC) designs are limited by probe technology. PTSL now solves this industry problem with its breakthrough PhazorRF technology, removing the performance barrier, enabling customers customer to ultimately shrink die size," added Mackellar.
PhazorRF's ultra-low loss, high bandwidth probe allows high device measurement accuracy from characterization to full ATE production. With customizable tip shapes and finishes, PhazorRF is adaptable for many applications from automotive and RF mobile chipsets to advanced high pin count AI processors. In addition to superior electrical performance, PhazorRF probes are more mechanically durable and designed for stable contact over a long lifetime.
For both engineering characterization and volume production, PhazorRF also overcomes the problem of testing over a broad bandwidth or high-frequency range, while maintaining high production throughput with higher levels of parallelism.
The PhazorRF technology is currently sampling to customers and was demonstrated at SWTest Conference, San Diego June 5-7, 2023. Volume production is targeted for the second half of 2023.
Click here to learn more about Probe Test Solutions Ltd (PTSL).
