The TSQA-1X8PME from Becker RF is a Fully Automatic HTOL RF Sub-system that operates from 300 to 6000 MHz. High-temperature Operating Lifetime (HTOL) testing is an intense stress test to simulate aging and accelerate thermally activated failure mechanisms. This 8-channel sub-system has an output power capability of up to 10 W per channel and each channel has an ALC for precise output power stability over long periods. It also has 8 input channels to monitor the DUT output power levels. This 50-ohm RF sub-system is equipped with an internal CW RF signal source and software to automate the complete testing process of components. Due to its wide frequency range, the device is suitable for tests of components for the 5G (FR1) standard.
The TSQA-1X8PME provides 85 dB of isolation between ports to ensure a failing DUT does not influence other DUTs during the tests. Each output channel provides a very precise RF output level with closed-loop level control (ALC), and virtually no visible steps. It has an adaptive harmonic filter for effective suppression of harmonics. This RF sub-system has LAN or USB interfaces for remote control and is controllable via GUI (Graphic User Interface). Alternatively, the system offers the control via an SCPI-inspired ASCII string protocol for ATE (Automatic Test Equipment) applications. It can run without human intervention during entire test periods of multiple months and supports automatic self-checking like current consumption, module temperature and logging of errors.
The TSQA-1X8PME is available in a 19-inch, 3U rackmount enclosure that measures 483 x 133 x 431 mm with SMA-female connectors. It is ideal for the qualification of components (e.g., active and passive cellular and wireless front-end components), quality assurance (new designs, batch verification), and research and development (R&D) applications. This RF sub-system has options for pulse modulators and automatic test sequencing. It requires an AC supply from 90 to 260 V and consumes 780 W of power.
