Vaunix has published a new technical brief, titled Insights on Evolving 5G MIMO Networks and Test Methods. This technical brief focuses on how modular RF test solutions tackle many of the challenges associated with millimeter-wave small cell, millimeter-wave multi-input/multi-output (MIMO), and Massive MIMO (Mu-MIMO) architectures for 5G wireless.
Detailed in the technical brief is how the drive toward 5G wireless systems is leading to a wide range of RF testing scenarios. This includes insights on the advantages and disadvantages of varying 5G deployment architectures, and the differences between frequency division duplexing (FDD) and time division duplexing (TDD) techniques.
The white paper describes how RF switches, phase shifters, attenuators, and signal generators are necessary in RF testing of these prototype technologies. As the number of RF test components increases with the complexity of the wireless system, especially when testing MIMO systems, the amount of components and RF test system complexity quickly skyrockets with this type of testing. Lastly, the technical brief describes how modular and scalable RF test solutions based on low-cost reconfigurable devices can lead to more easily setup test systems, faster time-to-market, more flexible testbeds, and lower recurring costs due to obsolete equipment replacements. Click here to download the Technical Brief.
