LitePoint recently announced that Nordic Semiconductor has validated its IQxel-M Bluetooth Advanced wireless test system for over-the-air (OTA) testing of products that use Nordic’s Bluetooth low energy Systems-on-Chip (SoCs).
This will enable IoT device makers utilizing Nordic’s nRF51 and nRF52 Series SoCs in their products to quickly perform critical OTA performance and functionality testing of their products to verify their designs and ramp to manufacturing. OTA testing is a requirement for Bluetooth LE devices that do not usually allow for traditional wired test methods because they are often fully encapsulated.
Additionally, products that include the nRF51 and nRF52 Series SoCs do not need special test firmware when utilizing the IQxel-M, but instead, utilize the system’s commercial firmware ensuring that the measurement results correlate with how the device is used in the end application.
Nordic’s nRF51 and nRF52 Series Bluetooth low energy SoCs are based on ARM M0, M4, and M4F processors and feature a range of devices with different features and Flash and RAM memory capacities for applications at all power consumption and cost levels. All Nordic’s Bluetooth low energy solutions are fully compliant with versions of Bluetooth technology from Bluetooth 4.0 to the latest release.
The IQxel-M is a comprehensive, one-box test solution for wireless connectivity testing and supports a wide variety of wireless standards including Wi-Fi, Bluetooth, Zigbee, LoRa, and Sigfox. IQxel-M also supports navigation technologies including GPS, GLONASS, and Beidou. The system can perform parallel testing of multiple devices (multi-DUT) while at the same time enabling the concurrent test of multiple technologies (Multicom™).
IQxel-M was built from the ground up for manufacturing with its rugged and compact design, the 2U-high chassis fits in a standard 19-inch rack, making it easy for rack and stack implementations.
For more information on LitePoint’s IoT Test solutions, click here.
