TS200-SE

Probe Station & System by MPI Corporation (7 more products)

Note : Your request will be directed to MPI Corporation.

TS200-SE Image

The TS200-SE from MPI Corporation is a Probe Station & System with Chuck Size 200 mm, Chuck Travel Resolution 1 µm. Tags: Manual. More details for TS200-SE can be seen below.

Product Specifications

View similar products

Product Details

  • Part Number
    TS200-SE
  • Manufacturer
    MPI Corporation
  • Description
    200 mm Manual Probe System

General Parameters

  • Chuck Size
    200 mm
  • Chuck Planarity
    ±10 um
  • Chuck Theta Coarse Travel
    ±360 Degree
  • Chuck Theta Fine Resolution
    ±7.5 x 10-3 Degrees
  • Chuck Travel Range
    225 x 260 mm
  • Chuck Travel Resolution
    1 µm
  • Chuck Z Fine Resolution
    1 µm
  • Chuck Z-Motion Range
    5 mm
  • Diameter
    210 mm
  • Material
    Nickel Plated Steel
  • Measurements Type
    DC, RF
  • Microscope Travel Resolution
    5 µm
  • Microsope Movement Range
    2 x 2 Inches
  • Number of DC Positioners
    8x, 4x
  • Number of RF Positioners
    4x
  • Connectors
    BNC, BNC - Female
  • Type
    Manual
  • Vacuum Hole Sections
    3 mm, 27 mm, 45 mm, 69 mm, 93 mm, 117 mm, 141 mm, 164 mm, 194 mm
  • Voltage
    500 V
  • Applications
    Device Characterization, Modeling, Wafer Level Reliability, Failure Analysis, IC Engineering and MEMS
  • Operating Temperature
    -60 to 300 Degree C

Technical Documents